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TIPO has released the English version of the “Patent Examination Guidelines, Part II: Substantive Examination for Invention Patents, Chapter 1. Written Description, Claim, Abstract and Drawing” to enhance the international IP community’s understanding of Taiwan’s patent examination process. Moreover, it functions as a helpful tool for foreign applicants, enabling them to assess whether their patent applications meet the requirements specified in said Guidelines.
To learn more about the “Patent Examination Guidelines, Part II: Substantive Examination for Invention Patents, Chapter 1. Written Description, Claim, Abstract and Drawing,” please click the link provided below:
https://www.tipo.gov.tw/en/lp-293-2.html
Source: TIPO